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Title: Speckle lithography for fabricating Gaussian, quasi-random 2D structures and black silicon structures
Authors: Bingi, Jayachandra
Murukeshan, Vadakke Matham
Issue Date: 2015
Source: Bingi, J., & Murukeshan, V. M. (2015). Speckle lithography for fabricating Gaussian, quasi-random 2D structures and black silicon structures. Scientific Reports, 5, 18452-.
Series/Report no.: Scientific Reports
Abstract: Laser speckle pattern is a granular structure formed due to random coherent wavelet interference and generally considered as noise in optical systems including photolithography. Contrary to this, in this paper, we use the speckle pattern to generate predictable and controlled Gaussian random structures and quasi-random structures photo-lithographically. The random structures made using this proposed speckle lithography technique are quantified based on speckle statistics, radial distribution function (RDF) and fast Fourier transform (FFT). The control over the speckle size, density and speckle clustering facilitates the successful fabrication of black silicon with different surface structures. The controllability and tunability of randomness makes this technique a robust method for fabricating predictable 2D Gaussian random structures and black silicon structures. These structures can enhance the light trapping significantly in solar cells and hence enable improved energy harvesting. Further, this technique can enable efficient fabrication of disordered photonic structures and random media based devices.
ISSN: 2045-2322
DOI: 10.1038/srep18452
Schools: School of Mechanical and Aerospace Engineering 
Rights: This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit
Fulltext Permission: open
Fulltext Availability: With Fulltext
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