Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/81849
Title: Joint Recognition of Error Correcting Codes and Interleaver Parameters in a Robust Environment
Authors: Swaminathan, Ramabadran
Madhukumar, A. S.
Keywords: Automatic recognition
Blind/semi-blind estimation
Issue Date: 2016
Source: Swaminathan, R., & MadhuKumar, A. S. (2016). Joint recognition of error correcting codes and interleaver parameters in a robust environment. 2016 IEEE 27th Annual International Symposium on Personal, Indoor, and Mobile Radio Communications (PIMRC), 16555847-.
Conference: 2016 IEEE 27th Annual International Symposium on Personal, Indoor, and Mobile Radio Communications (PIMRC)
Abstract: To improve the error performance of digital storage and communication systems, forward error correcting (FEC) codes and interleaver play a significant role by counteracting random and burst errors, respectively. In most of the applications, accurate information about the type of FEC codes, coding and interleaving parameters are known at the receiver in order to successfully decode and de-interleave the message bits, respectively. However, in certain applications such as spectrum surveillance, adaptive modulation and coding (AMC)-based communication systems, cognitive radio, etc., all the coding and interleaving parameters need not be known at the receiver and blind/semiblind recognition of the same is mandatory. Therefore, in this paper, innovative algorithms for automatic recognition of type of FEC codes along with the parameter estimation of helical scan interleaver are proposed considering both erroneous and non-erroneous scenarios without any prior knowledge about the encoding scheme used in the transmitter. Note that the proposed algorithms will classify among block coded, convolutional coded, and uncoded data streams.
URI: https://hdl.handle.net/10356/81849
http://hdl.handle.net/10220/42280
DOI: 10.1109/PIMRC.2016.7794694
Schools: School of Computer Science and Engineering 
Rights: © 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [https://doi.org/10.1109/PIMRC.2016.7794694].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCSE Conference Papers

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