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Title: Offline health diagnosis of power device based on nonintrusive inductively coupled approach
Authors: Yang, Hui-Chen
See, Kye Yak
Simanjorang, Rejeki
Li, Kang Rong
Keywords: Inductive Coupling
DRNTU::Engineering::Electrical and electronic engineering
Health Diagnosis
Issue Date: 2018
Source: Yang, H.-C., See, K. Y., Simanjorang, R., & Li, K. R. (2018). Offline health diagnosis of power device based on nonintrusive inductively coupled approach. IEEE Journal of Emerging and Selected Topics in Power Electronics, 6(4), 2053-2059. doi:10.1109/JESTPE.2018.2811753
Series/Report no.: IEEE Journal of Emerging and Selected Topics in Power Electronics
Abstract: Understanding the causes of a power device's defect plays a crucial role in failure and reliability analyses, and hence, the need of health diagnosis. Health diagnosis involves the measurement of predefined electrical parameters of a power device under its usual operating condition and the analyses of their deviations from their norms. Instead of the conventional direct measurements of voltage and current waveforms in time domain, this paper proposes a nonintrusive measurement method that measures the ON-state impedance of a power device in frequency domain. The proposed method eliminates direct electrical contact with the device-under-test, and it has the ability to detect the deviation of the ON-state impedance from its norm for health diagnosis purpose.
ISSN: 2168-6777
DOI: 10.1109/JESTPE.2018.2811753
Schools: School of Electrical and Electronic Engineering 
Rights: © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at:
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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