Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/82845
Title: Fault Injection Attacks: Attack Methodologies, Injection Techniques and Protection Mechanisms
Authors: Bhasin, Shivam
Mukhopadhyay, Debdeep
Keywords: Differential fault analysis
Fault injection attacks
Issue Date: 2016
Source: Bhasin, S., & Mukhopadhyay, D. (2016). Fault Injection Attacks: Attack Methodologies, Injection Techniques and Protection Mechanisms. 2016 International Conference on Security, Privacy, and Applied Cryptography Engineering, 415-418.
Abstract: Fault Injection Attacks are a powerful form of active attack mechanism which can threaten even the strongest of cryptographic algorithms. This attack vector has become more pertinent with the growing popularity of the Internet of things (IoT), which is based on small omnipresent embedded systems interacting with sensitive data of personal or critical nature. This tutorial addresses this issue of fault attacks, covering a wide range of topics which has accumulated through years of research. The first part of the talk will cover fault attacks and its application to attack standard cryptosystems. Different popular forms of fault attacks, namely Differential Fault Attacks (DFA) and Differential Fault Intensity Attacks (DFIA) are presented. It is followed subsequently by a discussion on the underlying injection techniques. Finally, protection mechanism will be discussed highlighting on information redundancy based reactive countermeasures and sensor-based protection mechanisms as two alternative strategies for security against the menacing fault attacks.
URI: https://hdl.handle.net/10356/82845
http://hdl.handle.net/10220/42605
DOI: 10.1007/978-3-319-49445-6_24
Rights: © 2016 Springer International Publishing AG. This is the author created version of a work that has been peer reviewed and accepted for publication by 2016 International Conference on Security, Privacy, and Applied Cryptography Engineering, Springer International Publishing AG. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://doi.org/10.1007/978-3-319-49445-6_24].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:TL Conference Papers

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