Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/82896
Title: Impulsive noise reduction for transient Earth voltage-based partial discharge using Wavelet-entropy
Authors: Luo, Guomin
Zhang, Daming
Tseng, King Jet
He, Jinghan
Keywords: Signal denoising
Issue Date: 2016
Source: Luo, G., Zhang, D., Tseng, K. J., & He, J. (2016). Impulsive noise reduction for transient Earth voltage-based partial discharge using Wavelet-entropy. IET Science, Measurement & Technology, 10(1), 69-76.
Series/Report no.: IET Science, Measurement & Technology
Abstract: Partial discharge (PD) is caused by the localized electrical field intensification in insulating materials. Early detection and accurate measurement of PD are very important for preventing premature failure of the insulating material. Detection of PDs in metal-clad apparatus through the Transient Earth Voltage (TEV) method is a promising approach in non-intrusive on-line tests. However, the electrical interference from background environment remains the major barrier to improving its measurement accuracy. In this paper, a wavelet-entropy-based PD de-noising method has been proposed. The unique features of PD are characterized by combining wavelet analysis that reveals the local features and entropy that measures the disorder. With such features, a feed-forward back-propagation Artificial Neural Network (ANN) is adopted to recognize the actual PDs from noisy background. Comparing with other methods such as the energy-based method and the similarity-comparing method, the proposed wavelet-entropy-based method is more effective in PD signal de-noising.
URI: https://hdl.handle.net/10356/82896
http://hdl.handle.net/10220/40376
ISSN: 1751-8822
DOI: 10.1049/iet-smt.2014.0203
Rights: © 2016 Institution of Engineering and Technology (IET). This is an open access article published by the IET under the Creative Commons Attribution-NonCommercial License (http://creativecommons.org/licenses/by-nc/3.0/)
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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