Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/82918
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dc.contributor.authorQiu, Leien
dc.contributor.authorTang, Kaien
dc.contributor.authorZheng, Yuanjinen
dc.contributor.authorSiek, Literen
dc.date.accessioned2016-04-01T03:02:30Zen
dc.date.accessioned2019-12-06T15:08:13Z-
dc.date.available2016-04-01T03:02:30Zen
dc.date.available2019-12-06T15:08:13Z-
dc.date.issued2015en
dc.identifier.citationQiu, L., Tang, K., Zheng, Y., & Siek, L. (2015). A digital time skew calibration technique for time-interleaved ADCs. 2015 IEEE International Symposium on Circuits and Systems (ISCAS), 2297-2300.en
dc.identifier.urihttps://hdl.handle.net/10356/82918-
dc.description.abstractIn this paper, a digital time skew calibration technique for time-interleaved (TI) ADCs is presented. The time skew calibration for TI-ADCs in analog domain suffers from limited correction accuracy and additional jitter. And the proposed digital time skew calibration method estimates the polarity of the time skew through correlation of adjacent channels and corrects the time error by adopting adaptive fractional delay filters iteratively. Simulation results show that, in a 4-channel 1GS/s 12-bit TI-ADC system, the SFDR can be improved to 78dB by 5-order FIR filters within a calibration range of [-0.005/fs, +0.005/fs].en
dc.format.extent4 p.en
dc.language.isoenen
dc.rights© 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/ISCAS.2015.7169142].en
dc.subjectElectrical and Electronic Engineeringen
dc.subjectAnalog to digital conversionen
dc.subjectCalibrationen
dc.titleA digital time skew calibration technique for time-interleaved ADCsen
dc.typeConference Paperen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.contributor.conference2015 IEEE International Symposium on Circuits and Systems (ISCAS)en
dc.identifier.doi10.1109/ISCAS.2015.7169142en
dc.description.versionAccepted versionen
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