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Title: 2D Monte Carlo simulation of a silicon waveguide-based single-photon avalanche diode for visible wavelengths
Authors: Yanikgonul, Salih
Leong, Victor
Ong, Jun Rong
Png, Ching Eng
Krivitsky, Leonid
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Integrated Optics Devices
Avalanche Photodiodes
Issue Date: 2018
Source: Yanikgonul, S., Leong, V., Ong, J. R., Png, C. E., & Krivitsky, L. (2018). 2D Monte Carlo simulation of a silicon waveguide-based single-photon avalanche diode for visible wavelengths. Optics Express, 26(12), 15232-. doi:10.1364/OE.26.015232
Series/Report no.: Optics Express
Abstract: Integrated photonics platforms are crucial to the development and implementation of scalable quantum information and networking schemes, but many such devices still rely on external bulk photodetectors. We report the design and simulation of a waveguide-based single-photon avalanche diode (SPAD) for visible wavelengths. The SPAD consists of a p-n junction implemented in a doped silicon waveguide, which is end-fire coupled to an input silicon nitride waveguide. We developed a 2D Monte Carlo model to simulate the avalanche multiplication process of charge carriers following the absorption of an input photon, and calculated the photon detection efficiency (PDE) and timing jitter of the SPAD. We investigated the SPAD performance at a wavelength of 640 nm and temperature of 243K for different device dimensions and device doping configurations. For our simulated parameters, we obtained a maximum PDE of 0.45 at a reverse bias voltage of ~20 V, and full-width-half-max (FWHM) timing jitter values <8 ps.
DOI: 10.1364/OE.26.015232
Schools: School of Electrical and Electronic Engineering 
Rights: © 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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