Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/83334
Title: Laser Profiling for the Back-Side Fault Attacks: With a Practical Laser Skip Instruction Attack on AES
Authors: Breier, Jakub
Jap, Dirmanto
Chen, Chien-Ning
Keywords: Fault Attack
Laser
Issue Date: 2015
Source: Breier, J., Jap, D., & Chen, C.-N. (2015). Laser Profiling for the Back-Side Fault Attacks: With a Practical Laser Skip Instruction Attack on AES. CPSS 2015 - Proceedings of the 1st ACM Workshop on Cyber-Physical System Security, 99-103.
Abstract: Laser fault injection is one of the strongest fault injection techniques. It offers a precise area positioning and a precise timing, allowing a high repeatability of experiments. In our paper we examine possibilities of laser-induced faults that could lead to instruction skips. After the profiling phase we were able to perform an attack on the last AddRoundKey operation in AES and to retrieve the secret key with just one faulty and correct ciphertext pair. Our experiments show very high degree of repeatability and 100% success rate with correct laser settings.
URI: https://hdl.handle.net/10356/83334
http://hdl.handle.net/10220/42519
DOI: 10.1145/2732198.2732206
Rights: © 2015 Association for Computing Machinery (ACM). This is the author created version of a work that has been peer reviewed and accepted for publication by CPSS 2015 - Proceedings of the 1st ACM Workshop on Cyber-Physical System Security, Association for Computing Machinery (ACM). It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1145/2732198.2732206].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Conference Papers
TL Conference Papers

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