Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/83379
Title: PLL to the Rescue: A Novel EM Fault Countermeasure
Authors: Miura, Noriyuki
Najm, Zakaria
He, Wei
Bhasin, Shivam
Ngo, Xuan Thuy
Nagata, Makoto
Danger, Jean-Luc
Keywords: Fault Attacks
Electromagnetic Attacks
Issue Date: 2016
Source: Miura, N., Najm, Z., He, W., Bhasin, S., Ngo, X. T., Nagata, M., et al. (2016). PLL to the rescue: A Novel EM Fault Countermeasure. Proceedings of the 53rd Annual Design Automation Conference, 90-.
Abstract: Electromagnetic injection (EMI) is a powerful and precise technique for fault injection in modern ICs. This intentional fault can be utilized to steal secret information hidden inside of ICs. Unlike laser fault injection, tedious package decapsulation is not needed for EMI, which reduces an attacker's cost and thus causes a serious information security threat. In this paper, a PLL-based sensor circuit is proposed to detect EMI reactively on chip. A fully automatic design flow is devised to integrate the proposed sensor together with a cryptographic processor. A high fault detection coverage and a small hardware overhead are demonstrated experimentally on an FPGA platform.
URI: https://hdl.handle.net/10356/83379
http://hdl.handle.net/10220/41437
DOI: 10.1145/2897937.2898065
Rights: © 2016 Association for Computing Machinery (ACM). This is the author created version of a work that has been peer reviewed and accepted for publication by Proceedings of the 53rd Annual Design Automation Conference, ACM. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1145/2897937.2898065].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:TL Conference Papers

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