Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/83485
Title: Highly Sensitive Detection of Polarized Light Using Anisotropic 2D ReS2
Authors: Liu, Fucai
Zheng, Shoujun
He, Xuexia
Chaturvedi, Apoorva
He, Junfeng
Chow, Wai Leong
Mion, Thomas R.
Wang, Xingli
Zhou, Jiadong
Fu, Qundong
Fan, Hong Jin
Tay, Beng Kang
Song, Li
He, Rui-Hua
Kloc, Christian
Ajayan, Pulickel M.
Liu, Zheng
Keywords: 2D materials
Anisotropy
Issue Date: 2016
Source: Liu, F., Zheng, S., He, X., Chaturvedi, A., He, J., Chow, W. L., et al. (2016). Highly Sensitive Detection of Polarized Light Using Anisotropic 2D ReS2. Advanced Functional Materials, 26(8), 1169-1177.
Series/Report no.: Advanced Functional Materials
Abstract: Due to the novel optical and optoelectronic properties, 2D materials have received increasing interests for optoelectronics applications. Discovering new properties and functionalities of 2D materials is challenging yet promising. Here broadband polarization sensitive photodetectors based on few layer ReS2 are demonstrated. The transistor based on few layer ReS2 shows an n-type behavior with the mobility of about 40 cm2 V−1 s−1 and on/off ratio of 105. The polarization dependence of photoresponse is ascribed to the unique anisotropic in-plane crystal structure, consistent with the optical absorption anisotropy. The linear dichroic photodetection with a high photoresponsivity reported here demonstrates a route to exploit the intrinsic anisotropy of 2D materials and the possibility to open up new ways for the applications of 2D materials for light polarization detection.
URI: https://hdl.handle.net/10356/83485
http://hdl.handle.net/10220/42618
ISSN: 1616-301X
DOI: 10.1002/adfm.201504546
Rights: © 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. This is the author created version of a work that has been peer reviewed and accepted for publication by Advanced Functional Materials, WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1002/adfm.201504546].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles
MSE Journal Articles
SPMS Journal Articles

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