Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/83638
Title: High-performance GeSn photodetector and fin field-effect transistor (FinFET) on an advanced GeSn-on-insulator platform
Authors: Wang, Wei
Lei, Dian
Huang, Yi-Chiau
Lee, Kwang Hong
Loke, Wan-Khai
Dong, Yuan
Xu, Shengqiang
Tan, Chuan Seng
Wang, Hong
Yoon, Soon-Fatt
Gong, Xiao
Yeo, Yee-Chia
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Optoelectronics
Integrated Optics
Issue Date: 2018
Source: Wang, W., Lei, D., Huang, Y.-C., Lee, K. H., Loke, W.-K., Dong, Y., . . . Yeo, Y.-C. (2018). High-performance GeSn photodetector and fin field-effect transistor (FinFET) on an advanced GeSn-on-insulator platform. Optics Express, 26(8), 10305-.
Series/Report no.: Optics Express
Abstract: We report the first demonstration of high-performance GeSn metal-semiconductor-metal (MSM) photodetector and GeSn p-type fin field-effect transistor (pFinFET) on an advanced GeSn-on-insulator (GeSnOI) platform by complementary metal-oxide-semiconductor (CMOS) compatible processes. The detection range of GeSn photodetector is extended beyond 2 µm, with responsivities of 0.39 and 0.10 A/W at 1550 nm and 2003 nm, respectively. Through the insertion of an ultrathin Al2O3 Schottky-barrier-enhancement layer, the dark current IDark of the GeSn photodetector is suppressed by more than 2 orders of magnitude. An impressive IDark of ~65 nA was achieved at an operating voltage of 1.0 V. A frequency response measurement reveals the achievement of a 3-dB bandwidth of ~1.4 GHz at an illumination wavelength of 2 µm. GeSn pFinFET with fin width (Wfin) scaled down to 15 nm was also fabricated on the GeSnOI platform, exhibiting a small subthreshold swing (S) of 93 mV/decade, a high drive current of 176 µA/µm, and good control of short channel effects (SCEs). This work paves the way for realizing compact, low-cost, and multi-functional GeSn-on-insulator opto-electronic integrated circuits.
URI: https://hdl.handle.net/10356/83638
http://hdl.handle.net/10220/47598
DOI: 10.1364/OE.26.010305
Rights: © 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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