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Title: Invisibility Dips of Near-Field Energy Transport in a Spoof Plasmonic Metadimer
Authors: Gao, Fei
Gao, Zhen
Luo, Yu
Zhang, Baile
Keywords: Metamaterials
Issue Date: 2016
Source: Gao, F., Gao, Z., Luo, Y., & Zhang, B. (2016). Invisibility Dips of Near-Field Energy Transport in a Spoof Plasmonic Metadimer. Advanced Functional Materials, 26(45), 8307-8312.
Series/Report no.: Advanced Functional Materials
Abstract: Invisibility dips, i.e., minima in scattering spectrum associated with asymmetric Fano-like line-shapes, have been predicted with transformation optics in studying strong coupling between two plasmonic nanoparticles. This feature of strongly coupled plasmonic nanoparticles holds promise for sensor cloaking. It requires an extremely narrow gap between the two nanoparticles, preventing its experimental observation at optical frequencies. Here, the concept of spoof surface plasmons is used to facilitate the strong coupling between two spoof-localized-surface-plasmon (SLSP) resonators. Instead of observing in far field, the near-field energy transport is probed through the two SLSP resonators. By virtue of enhanced coupling between the two resonators stacked vertically, a spectral transmission dip with asymmetric Fano-like line-shape, similar to the far-field “invisibility dips” predicted by transformation optics, is observed. The underlying mode interference mechanism is further demonstrated by directly imaging the field maps of interfered waves that are tightly localized around the resonators. These near-field “invisibility dips” may find use in near-field sensing, on-chip switching, filters, and logical operation elements.
ISSN: 1616-301X
DOI: 10.1002/adfm.201602233
Schools: School of Electrical and Electronic Engineering 
School of Physical and Mathematical Sciences 
Rights: © 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. This is the author created version of a work that has been peer reviewed and accepted for publication by Advanced Functional Materials, WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles
SPMS Journal Articles

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