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Title: Probing topological protection using a designer surface plasmon structure
Authors: Gao, Fei
Gao, Zhen
Shi, Xihang
Yang, Zhaoju
Lin, Xiao
Xu, Hongyi
Joannopoulos, John D.
Soljačić, Marin
Chen, Hongsheng
Lu, Ling
Chong, Yidong
Zhang, Baile
Keywords: Electronic Properties and Materials
Optical Physics
Issue Date: 2016
Source: Gao, F., Gao, Z., Shi, X., Yang, Z., Lin, X., Xu, H., et al. (2016). Probing topological protection using a designer surface plasmon structure. Nature Communications, 7, 11619-.
Series/Report no.: Nature Communications
Abstract: Topological photonic states, inspired by robust chiral edge states in topological insulators, have recently been demonstrated in a few photonic systems, including an array of coupled on-chip ring resonators at communication wavelengths. However, the intrinsic difference between electrons and photons determines that the ‘topological protection’ in time-reversal-invariant photonic systems does not share the same robustness as its counterpart in electronic topological insulators. Here in a designer surface plasmon platform consisting of tunable metallic sub-wavelength structures, we construct photonic topological edge states and probe their robustness against a variety of defect classes, including some common time-reversal-invariant photonic defects that can break the topological protection, but do not exist in electronic topological insulators. This is also an experimental realization of anomalous Floquet topological edge states, whose topological phase cannot be predicted by the usual Chern number topological invariants.
ISSN: 2041-1723
DOI: 10.1038/ncomms11619
Rights: © 2016 The Author(s). This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Journal Articles

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