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|Title:||0.2 V 8T SRAM With PVT-Aware Bitline Sensing and Column-Based Data Randomization||Authors:||Do, Anh Tuan
Lee, Zhao Chuan
Kim, Tony Tae-Hyoung
|Issue Date:||2016||Source:||Do, A. T., Lee, Z. C., Wang, B., Chang, I. J., Liu, X., & Kim, T. T. H. (2016). 0.2 V 8T SRAM With PVT-Aware Bitline Sensing and Column-Based Data Randomization. IEEE Journal of Solid-State Circuits, 51(6), 1487-1498.||Series/Report no.:||IEEE Journal of Solid-State Circuits||Abstract:||In sub/near-threshold operation, SRAMs suffer from considerable bitline swing degradation when the data pattern of a column is skewed to ‘1’ or ‘0’. The worst scenarios regarding this problem occur when the currently read SRAM cell has different data compared to the rest of the cells in the same column. In this work, we overcome this challenge by using a column-based randomization engine (CBRE). This CBRE circuit randomizes data stored to SRAM. This makes distribution of “1” and “0” in each column close to 50%, significantly increasing bitline swing. To further improve the bitline swing, we employ bitline boost biasing and dynamic bitline keeper schemes. Based on the mentioned techniques, we fabricated a 256 rows×128 columns (32Kb) 8T SRAM array in 65 nm CMOS technology. In our silicon measurement, the SRAM array shows successful 200 mV operation at room temperature, where energy consumption and access time are 1 pJ and 2.5 s, respectively.||URI:||https://hdl.handle.net/10356/84030
|ISSN:||0018-9200||DOI:||10.1109/JSSC.2016.2540799||Rights:||© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [Article URL/DOI].||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Journal Articles|
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