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Title: Hardness of k-LWE and Applications in Traitor Tracing
Authors: Ling, San
Phan, Duong Hieu
Stehlé, Damien
Steinfeld, Ron
Keywords: Lattice-based cryptography
Traitor tracing
Issue Date: 2016
Source: Ling, S., Phan, D. H., Stehlé, D., & Steinfeld, R. (2016). Hardness of k-LWE and Applications in Traitor Tracing. Algorithmica, 79(4), 1318-1352.
Series/Report no.: Algorithmica
Abstract: We introduce the k-LWE problem, a Learning With Errors variant of the k-SIS problem. The Boneh-Freeman reduction from SIS to k-SIS suffers from an exponential loss in k. We improve and extend it to an LWE to k-LWE reduction with a polynomial loss in k, by relying on a new technique involving trapdoors for random integer kernel lattices. Based on this hardness result, we present the first algebraic construction of a traitor tracing scheme whose security relies on the worst-case hardness of standard lattice problems. The proposed LWE traitor tracing is almost as efficient as the LWE encryption. Further, it achieves public traceability, i.e., allows the authority to delegate the tracing capability to “untrusted” parties. To this aim, we introduce the notion of projective sampling family in which each sampling function is keyed and, with a projection of the key on a well chosen space, one can simulate the sampling function in a computationally indistinguishable way. The construction of a projective sampling family from k-LWE allows us to achieve public traceability, by publishing the projected keys of the users. We believe that the new lattice tools and the projective sampling family are quite general that they may have applications in other areas.
ISSN: 0178-4617
DOI: 10.1007/s00453-016-0251-7
Schools: School of Physical and Mathematical Sciences 
Rights: © 2016 Springer Science+Business Media New York. This is the author created version of a work that has been peer reviewed and accepted for publication by Algorithmica, Springer Science+Business Media New York. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Journal Articles

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