Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/84544
Title: Dielectric relaxation in AC powder electroluminescent devices
Authors: Zhang, Shuai
Su, Haibin
Tan, Chuan Seng
Wong, Terence Kin Shun
Teo, Ronnie Jin Wah
Keywords: AC powder electroluminescent devices
dielectric properties
Issue Date: 2016
Source: Zhang, S., Su, H., Tan, C. S., Wong, T. K. S., & Teo, R. J. W. (2017). Dielectric relaxation in AC powder electroluminescent devices. Solid State Communications, 250, 53-56.
Series/Report no.: Solid State Communications
Abstract: The dielectric properties of AC powder electroluminescent devices were measured and analyzed using complex impedance spectroscopy to determine the relaxation processes occurring within the devices. The relaxation processes identified were ascribed to the electrode polarization caused by ion accumulation at the electrode/resin interfaces, the Maxwell-Wagner-Sillars effects at the (ZnS or BaTiO3) particle/resin interfaces, and the dipolar reorientation of polymer chains in the resin matrix. Each relaxation process was represented by its corresponding equivalent circuit component. Space charge polarization at the electrodes were represented by a Warburg element, a resistor, and a constant phase element. The resin matrix, ZnS/resin and BaTiO3/resin interfaces could each be modeled by a resistor and a capacitor in parallel. The simulated equivalent circuits for three different printed structures showed good fitting with their experimental impedance results.
URI: https://hdl.handle.net/10356/84544
http://hdl.handle.net/10220/41880
ISSN: 0038-1098
DOI: 10.1016/j.ssc.2016.11.010
Schools: School of Electrical and Electronic Engineering 
School of Materials Science & Engineering 
Organisations: A*STAR SIMTech
Rights: © 2016 Elsevier Ltd. This is the author created version of a work that has been peer reviewed and accepted for publication by Solid State Communications, Elsevier Ltd. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1016/j.ssc.2016.11.010].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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