Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/84911
Title: Direct comparison transfer of microwave power sensor calibration with an adaptor : modeling and evaluation
Authors: Lin, Zhiping
Zhang, Qian.
Meng, Yu Song.
Shan, Yueyan.
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2013
Source: Zhang, Q., Meng, Y. S., Shan, Y., & Lin, Z. (2013). Direct comparison transfer of microwave power sensor calibration with an adaptor : modeling and evaluation. Progress in electromagnetics research letters, 38, 25-34.
Series/Report no.: Progress in electromagnetics research letters
Abstract: In this paper, calibration of a microwave power sensor with an adaptor is investigated with direct comparison transfer technique, and mathematically modeled using signal flow-graphs together with non-touching loop rules. The developed calibration model is then implemented practically with a 30 dB attenuator as the adaptor. Its performance is evaluated following the Guide to the Expression of Uncertainty in Measurement and also verified with the Monte Carlo method. Good agreements are observed with all the error |En| ≤ 0.25 over the whole frequency range (up to 18 GHz).
URI: https://hdl.handle.net/10356/84911
http://hdl.handle.net/10220/18439
Schools: School of Electrical and Electronic Engineering 
Rights: © 2013 EMW Publishing. This paper was published in Progress In Electromagnetics Research Letters and is made available as an electronic reprint (preprint) with permission of EMW Publishing. The paper can be found at the following official OpenURL: [http://www.jpier.org/PIERL/pier.php?paper=13012203]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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