Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/84924
Title: A nanomachined optical logic gate driven by gradient optical force
Authors: Tao, J. F.
Wu, J.
Cai, H.
Zhang, Q. X.
Tsai, J. M.
Lin, J. T.
Liu, A. Q.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics
Issue Date: 2012
Source: Tao, J. F., Wu, J., Cai, H., Zhang, Q. X., Tsai, J. M., Lin, J. T., et al. (2012). A nanomachined optical logic gate driven by gradient optical force. Applied Physics Letters, 100(11), 113104-.
Series/Report no.: Applied physics letters
Abstract: In this letter, a nanomachined optical logic gate using optical gradient force is demonstrated. The device consists of a partially free-hanging silicon double-ring resonator developed by the nano-electro-mechanical system technology. The logic NOR gate function is demonstrated at 20 Mb/s with a high extinction ratio of about 21.3 dB. This proposed NOR gate has the advantages of low power consumption (∼0.5 mW), highly compacted size (40 μm × 45 μm), and easy batch fabrication which has potential applications in silicon-photonic integration for digital signal processing.
URI: https://hdl.handle.net/10356/84924
http://hdl.handle.net/10220/9129
ISSN: 0003-6951
DOI: 10.1063/1.3693610
Schools: School of Electrical and Electronic Engineering 
Rights: © 2012 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.3693610]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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