Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/85033
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dc.contributor.authorHuang, Song.en
dc.contributor.authorLiu, Yitao.en
dc.contributor.authorZhang, Daming.en
dc.date.accessioned2013-07-15T06:26:08Zen
dc.date.accessioned2019-12-06T15:55:56Z-
dc.date.available2013-07-15T06:26:08Zen
dc.date.available2019-12-06T15:55:56Z-
dc.date.copyright2012en
dc.date.issued2012en
dc.identifier.citationZhang, D., Liu, Y., & Huang, S. (2012). Differential Evolution Based Parameter Identification of Static and Dynamic J-A Models and Its Application to Inrush Current Study in Power Converters. IEEE Transactions on Magnetics, 48(11), 3482-3485.en
dc.identifier.urihttps://hdl.handle.net/10356/85033-
dc.identifier.urihttp://hdl.handle.net/10220/11420en
dc.description.abstractThe Jiles-Atherton (J-A) model is very suitable for modeling ferrite-core based inductors and transformers. In this paper the differential evolution (DE) method was applied to extract five parameters in static J-A model first. Then it was applied to extract another two parameters in dynamic J-A model with five parameters in static J-A model as inputs. It is found that extracting five parameters in static J-A model is relatively easy but extracting another two parameters in dynamic J-A model needs extra effort, especially specifying their ranges. After obtaining all seven parameters, we applied dynamic J-A model to predict the current behavior of a practical switching circuit and successfully obtained the inrush current phenomenon as experimentally observed and reported in literature. We conclude that application of DE method to extract seven parameters in dynamic J-A model for ferrite is feasible.en
dc.language.isoenen
dc.relation.ispartofseriesIEEE transactions on magneticsen
dc.rights© 2012 IEEE.en
dc.subjectDRNTU::Engineering::Electrical and electronic engineeringen
dc.titleDifferential evolution based parameter identification of static and dynamic J-A models and its application to inrush current study in power convertersen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.identifier.doi10.1109/TMAG.2012.2196984en
item.fulltextNo Fulltext-
item.grantfulltextnone-
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