Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/85216
Title: Identifying key factors towards highly reflective silver coatings
Authors: Zheng, Bo
Wong, Lai Peng
Wu, Linda Y. L.
Chen, Zhong
Keywords: Reflectance
Coating
DRNTU::Engineering::Materials
Issue Date: 2017
Source: Zheng, B., Wong, L. P., Wu, L. Y. L., & Chen, Z. (2017). Identifying key factors towards highly reflective silver coatings. Advances in Materials Science and Engineering, 2017, 7686983-. doi:10.1155/2017/7686983
Series/Report no.: Advances in Materials Science and Engineering
Abstract: This paper attempts to identify key factor(s) for highly reflective silver (Ag) coatings. Investigation was made over the crystal orientation and surface roughness, using several types of surfaces, including electroplated Ag polycrystal films, physical vapour deposited polycrystal Ag films, and single crystal Ag foils with different crystal orientations. In each type of the surfaces, surface roughness was varied so that, for different combinations of crystal orientation, roughness would elucidate the key factors towards highly reflective Ag coatings. It is found that surface roughness plays a critical role in determining the reflectance, while the crystal orientation has negligible effect. The mean reflectance and one-way ANOVA analysis indicate that the single crystal Ag foils with three orientations performed statistically the same in the same roughness group at significance level 𝛼� = 0.05. Moreover, correlation between the surface reflectance and surface roughness has been proposed for the benefit of coating design. Refection data obtained from the polycrystalline silver samples are used to verify the accuracy of the proposed correlations. It was observed that the development surface area ratio, 𝑆�𝑑�𝑟�, is a better roughness indicator in predicting the reflectance of polycrystalline silver films than the arithmetic average roughness, 𝑅�𝑎�.
URI: https://hdl.handle.net/10356/85216
http://hdl.handle.net/10220/48197
ISSN: 1687-8434
DOI: 10.1155/2017/7686983
Rights: © 2017 Bo Zheng et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MSE Journal Articles

Files in This Item:
File Description SizeFormat 
Identifying Key Factors towards Highly Reflective.pdf5.87 MBAdobe PDFThumbnail
View/Open

SCOPUSTM   
Citations 20

5
Updated on Mar 5, 2021

PublonsTM
Citations 20

3
Updated on Mar 3, 2021

Page view(s)

52
Updated on Apr 15, 2021

Download(s)

13
Updated on Apr 15, 2021

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.