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Title: Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization
Authors: Gan, C. L.
Lewis, D.
Infante, F.
Perdu, P.
Kor, H. B.
Keywords: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
Issue Date: 2011
Source: Infante, F., Perdu, P., Kor, H. B., Gan, C. L., & Lewis, D. (2011). Magnetic field spatial Fourier analysis: a new opportunity for high resolution current localization. Microelectronics Reliability, 51 (9-11).
Series/Report no.: Microelectronics reliability
Abstract: Magnetic microscopy has proven its usefulness throughout the years. It allows current localization with a certain degree of precision by using an inversion algorithm to invert the Biot–Savart law. The goal is to obtain the current distribution once the magnetic field is given. However, in order to obtain a stable solution, the magnetic data is severely low-pass filtered in the spatial Fourier domain, and some important information is lost. In this paper, the contribution given by the different spatial frequencies was studied: it was demonstrated how this information can be used to obtain additional information regarding the position of the currents. A comparative study between the theoretical approach and the application to the measurements is also shown.
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2011.07.076
Rights: © 2011 Elsevier.This is the author created version of a work that has been peer reviewed and accepted for publication by Microelectronics Reliability, Elsevier.  It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document.  The published version is available at:
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MSE Journal Articles

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