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Title: The Young-Feynman controlled double-slit electron interference experiment
Authors: Tavabi, Amir H.
Boothroyd, Chris B.
Yücelen, Emrah
Frabboni, Stefano
Gazzadi, Gian Carlo
Dunin-Borkowski, Rafal E.
Pozzi, Giulio
Keywords: Engineering::Materials
Transmission Electron Microscopy
Quantum Optics
Issue Date: 2019
Source: Tavabi, A. H., Boothroyd, C. B., Yücelen, E., Frabboni, S., Gazzadi, G. C., Dunin-Borkowski, R. E., & Pozzi, G. (2019). The Young-Feynman controlled double-slit electron interference experiment. Scientific Reports, 9(1), 10458-. doi:10.1038/s41598-019-43323-2
Series/Report no.: Scientific Reports
Abstract: The key features of quantum mechanics are vividly illustrated by the Young-Feynman two-slit thought experiment, whose second part discusses the recording of an electron distribution with one of the two slits partially or totally closed by an aperture. Here, we realize the original Feynman proposal in a modern electron microscope equipped with a high brightness gun and two biprisms, with one of the biprisms used as a mask. By exciting the microscope lenses to conjugate the biprism plane with the slit plane, observations are carried out in the Fraunhofer plane with nearly ideal control of the covering of one of the slits. A second, new experiment is also presented, in which interference phenomena due to partial overlap of the slits are observed in the image plane. This condition is obtained by inserting the second biprism between the two slits and the first biprism and by biasing it in order to overlap their images.
DOI: 10.1038/s41598-019-43323-2
Rights: © 2019 The Author(s). This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. Te images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MSE Journal Articles

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