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Title: Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure
Authors: Ng, Chee Seng
Baek, Jong Dae
Zade, Vishal
Villegas, Adrian
Lee, Tsung-Han
Su, Pei-Chen
Martini, Ashlie
Lee, Min Hwan
Keywords: DRNTU::Engineering::Mechanical engineering
Issue Date: 2016
Source: Ng, C. S., Baek, J. D., Zade, V., Villegas, A., Lee, T.-H., Su, P.-C., . . . Lee, M. H. (2016). Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure. ECS Transactions, 72(28), 11-20. doi:10.1149/07228.0011ecst
Series/Report no.: ECS Transactions
Abstract: Atomic force microscopy (AFM)-based study of electrical and electrochemical properties of a material/system at an elevated temperature in atmospheric pressure has been limited to ~250°C in conventional AFM setups. In this report, we have demonstrated the viability of a new approach for high temperature electrical and electrochemical studies (up to 700°C) in a conventional AFM setup by employing a combination of a micron-scale heater stage (MHS) and custom-made all-metal tips. We present the design, fabrication process and characterization of the MHS and all-metal tips. A temperature dependent impedance measurement on an MHS-integrated half-cell was then successfully demonstrated with a custom-made Pt-Ir tip. Issues and possible room to improve regarding the new approach are also discussed.
ISSN: 1938-5862
DOI: 10.1149/07228.0011ecst
Rights: © 2016 The Electrochemical Society. All rights reserved. This paper was published in ECS Transactions and is made available with permission of The Electrochemical Society.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Journal Articles

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