Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/85475
Full metadata record
DC FieldValueLanguage
dc.contributor.authorChua, C. T.en
dc.contributor.authorLiu, Q.en
dc.contributor.authorChef, Samuelen
dc.contributor.authorSanchez, K.en
dc.contributor.authorPcrdu, P.en
dc.contributor.authorGan, Chee Lipen
dc.date.accessioned2019-10-10T05:33:57Zen
dc.date.accessioned2019-12-06T16:04:25Z-
dc.date.available2019-10-10T05:33:57Zen
dc.date.available2019-12-06T16:04:25Z-
dc.date.issued2018en
dc.identifier.citationChua, C., Liu, Q., Chef, S., Sanchez, K., Pcrdu, P., & Gan, C. (2018). Failure Analysis of Damages on Advanced Technologies Induced by Picosecond Pulsed Laser During Space Radiation SEE Testing. 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 1-6. doi:10.1109/IPFA.2018.8452544en
dc.identifier.urihttps://hdl.handle.net/10356/85475-
dc.description.abstractPicosecond pulsed laser, customarily perceived to offer advantages of flexibility and ease of testing over heavy ion particle accelerator test, was conducted on a chain of inverters during Single Event Effect (SEE) evaluation. In this paper, we report on the unexpected permanent damage induced by 1064 nm pulsed laser on test structures fabricated with 65 nm bulk CMOS process technology. Light emission microscopy (EMMI) localized hotspots within the area previously scanned by the pulsed laser. Electro Optical Frequency Mapping (EOFM) verified the undesired termination of signal propagation along the chain of inverters while Electro Optical Probing (EOP) confirmed the unexpected phase change and eventual loss of the output signal waveform. Focused Ion Beam (FIB), Transmission Microscopy (TEM) and Energy Dispersive X-ray spectroscopy (EDX) confirmed the physical failure and identified nickel as the diffusing species. This paper aims to advise caution to the research communities (both space radiation and optical failure analysis) in employing similar laser test technique and highlights the need to define the safe operating region of such technique, especially for emerging technology nodes.en
dc.format.extent6 p.en
dc.language.isoenen
dc.relation.ispartofseries2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)en
dc.rights© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/IPFA.2018.8452544.en
dc.subjectPulsed Laseren
dc.subject1064 nmen
dc.subjectEngineering::Materialsen
dc.titleFailure analysis of damages on advanced technologies induced by picosecond pulsed laser during space radiation SEE testingen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Materials Science & Engineeringen
dc.contributor.conference2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)en
dc.contributor.researchTemasek Laboratoriesen
dc.identifier.doi10.1109/IPFA.2018.8452544en
dc.description.versionAccepted versionen
item.fulltextWith Fulltext-
item.grantfulltextopen-
Appears in Collections:TL Journal Articles

Page view(s)

319
Updated on Dec 5, 2022

Download(s) 20

145
Updated on Dec 5, 2022

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.