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Title: A 2.6–3.4 ghz fractional-N sub-sampling phase-locked loop using a calibration-free phase-switching-sub-sampling technique
Authors: Liang, Zhipeng
Yi, Xiang
Yang, Kaituo
Boon, Chirn Chye
Keywords: Calibration Free
CMOS Phase-Locked Loop
DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2018
Source: Liang, Z., Yi, X., Yang, K., & Boon, C. C. (2018). A 2.6–3.4 ghz fractional-N sub-sampling phase-locked loop using a calibration-free phase-switching-sub-sampling technique. IEEE Microwave and Wireless Components Letters, 28(2), 147-149. doi:10.1109/LMWC.2017.2779889
Series/Report no.: IEEE Microwave and Wireless Components Letters
Abstract: Sub-sampling phase-locked loop (SSPLL) achieves lower in-band phase noise compared to a conventional charge-pump phase-locked loop with frequency dividers. Recently, several works have been reported to enable fractional-N operation of SSPLL to broaden its applications. However, they require careful calibrations with extra silicon area and adjusting time (20 ms measured) to achieve low phase noise. For scenarios requiring short settling time such as frequency modulation, such a time consuming calibration is undesirable. This letter presents a phase-switching technique for fractional-N mode SSPLL to eliminate this calibration. The principle of the technique is analyzed and a prototype is fabricated in 65-nm CMOS technology. Even without calibration, the frequency synthesizer achieves a figure of merit of -234.3 dB under fractional-N operation, with 13.3-mW power consumption at 1.2-V supply.
ISSN: 1531-1309
DOI: 10.1109/LMWC.2017.2779889
Rights: © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at:
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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