Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/86017
Title: An analytic gabor feedforward network for single-sample and pose-invariant face recognition
Authors: Oh, Beom-Seok
Toh, Kar-Ann
Teoh, Andrew Beng Jin
Lin, Zhiping
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Face Recognition Across Pose
Gabor Filtering
Issue Date: 2018
Source: Oh, B.-S., Toh, K.-A., Teoh, A. B. J., & Lin, Z. (2018). An Analytic Gabor Feedforward Network for Single-Sample and Pose-Invariant Face Recognition. IEEE Transactions on Image Processing, 27(6), 2791-2805. doi:10.1109/TIP.2018.2809040
Series/Report no.: IEEE Transactions on Image Processing
Abstract: Gabor magnitude is known to be among the most discriminative representations for face images due to its space- frequency co-localization property. However, such property causes adverse effects even when the images are acquired under moderate head pose variations. To address this pose sensitivity issue and other moderate imaging variations, we propose an analytic Gabor feedforward network which can absorb such moderate changes. Essentially, the network works directly on the raw face images and produces directionally projected Gabor magnitude features at the hidden layer. Subsequently, several sets of magnitude features obtained from various orientations and scales are fused at the output layer for final classification decision. The network model is analytically trained using a single sample per identity. The obtained solution is globally optimal with respect to the classification total error rate. Our empirical experiments conducted on five face data sets (six subsets) from the public domain show encouraging results in terms of identification accuracy and computational efficiency.
URI: https://hdl.handle.net/10356/86017
http://hdl.handle.net/10220/48271
ISSN: 1057-7149
DOI: 10.1109/TIP.2018.2809040
Schools: School of Electrical and Electronic Engineering 
Rights: © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/TIP.2018.2809040.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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