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Title: Self-protected thermometry with infrared photons and defect spins in silicon carbide
Authors: Zhou, Yu
Wang, Junfeng
Zhang, Xiaoming
Li, Ke
Cai, Jianming
Gao, Weibo
Keywords: Solid-state Detectors
Optically Detected Magnetic Resonance
Issue Date: 2017
Source: Zhou, Y., Wang, J., Zhang, X., Li, K., Cai, J., & Gao, W. (2017). Self-Protected Thermometry with Infrared Photons and Defect Spins in Silicon Carbide. Physical Review Applied, 8(4), 044015-.
Series/Report no.: Physical Review Applied
Abstract: Quantum sensors with solid-state spins have attracted considerable interest due to their advantages in high sensitivity and high spatial resolution. The robustness against environmental noise is a critical requirement for solid-state spin sensors. In this paper, we present a self-protected infrared high-sensitivity thermometry based on spin defects in silicon carbide. Based on the conclusion that the Ramsey oscillations of the spin sensor are robust against magnetic noise due to a self-protected mechanism from the intrinsic transverse strain of the defect, we experimentally demonstrate the Ramsey-based thermometry. The self-protected infrared silicon-carbide thermometry may provide a promising platform for high sensitivity and high-spatial-resolution temperature sensing in a practical noisy environment, especially in biological systems and microelectronics systems.
DOI: 10.1103/PhysRevApplied.8.044015
Rights: © 2017 American Physical Society (APS). This paper was published in Physical Review Applied and is made available as an electronic reprint (preprint) with permission of American Physical Society (APS). The published version is available at: []. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Journal Articles

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