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|Title:||Correlated fluorescence blinking in two-dimensional semiconductor heterostructures||Authors:||Xu, Weigao
Schmidt, Jan F.
Seletskiy, Denis V.
|Issue Date:||2017||Source:||Xu, W., Liu, W., Schmidt, J. F., Zhao, W., Lu, X., Raab, T., et al. (2017). Correlated fluorescence blinking in two-dimensional semiconductor heterostructures. Nature, 541(7635), 62-67.||Series/Report no.:||Nature||Abstract:||‘Blinking’, or ‘fluorescence intermittency’, refers to a random switching between ‘ON’ (bright) and ‘OFF’ (dark) states of an emitter; it has been studied widely in zero-dimensional quantum dots1 and molecules2, 3, and scarcely in one-dimensional systems4, 5. A generally accepted mechanism for blinking in quantum dots involves random switching between neutral and charged states6, 7 (or is accompanied by fluctuations in charge-carrier traps8), which substantially alters the dynamics of radiative and non-radiative decay. Here, we uncover a new type of blinking effect in vertically stacked, two-dimensional semiconductor heterostructures9, which consist of two distinct monolayers of transition metal dichalcogenides (TMDs) that are weakly coupled by van der Waals forces. Unlike zero-dimensional or one-dimensional systems, two-dimensional TMD heterostructures show a correlated blinking effect, comprising randomly switching bright, neutral and dark states. Fluorescence cross-correlation spectroscopy analyses show that a bright state occurring in one monolayer will simultaneously lead to a dark state in the other monolayer, owing to an intermittent interlayer carrier-transfer process. Our findings suggest that bilayer van der Waals heterostructures provide unique platforms for the study of charge-transfer dynamics and non-equilibrium-state physics, and could see application as correlated light emitters in quantum technology.||URI:||https://hdl.handle.net/10356/86302
|ISSN:||0028-0836||DOI:||10.1038/nature20601||Rights:||© 2017 Macmillan Publishers Limited, part of Springer Nature.||Fulltext Permission:||none||Fulltext Availability:||No Fulltext|
|Appears in Collections:||EEE Journal Articles|
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