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Title: Education models in the new era : an insight into testing and assessment.
Authors: Low, Mei Ling.
Sun, Cui Ling.
Wang, Mee Yeng.
Keywords: DRNTU::Business::General::Education
Issue Date: 2002
Abstract: This paper attempts to gather learners’ views on the testing and assessment framework in Singapore, and to investigate whether these components exert backwash effect on learning.
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:NBS Student Reports (FYP/IA/PA/PI)

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