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https://hdl.handle.net/10356/87246
Title: | Learning to Monitor Machine Health with Convolutional Bi-Directional LSTM Networks | Authors: | Zhao, Rui Yan, Ruqiang Wang, Jinjiang Mao, Kezhi |
Keywords: | Machine Health Monitoring Tool Wear Prediction |
Issue Date: | 2017 | Source: | Zhao, R., Yan, R., Wang, J., & Mao, K. (2017). Learning to Monitor Machine Health with Convolutional Bi-Directional LSTM Networks. Sensors, 17(2), 273-. | Series/Report no.: | Sensors | Abstract: | In modern manufacturing systems and industries, more and more research efforts have been made in developing effective machine health monitoring systems. Among various machine health monitoring approaches, data-driven methods are gaining in popularity due to the development of advanced sensing and data analytic techniques. However, considering the noise, varying length and irregular sampling behind sensory data, this kind of sequential data cannot be fed into classification and regression models directly. Therefore, previous work focuses on feature extraction/fusion methods requiring expensive human labor and high quality expert knowledge. With the development of deep learning methods in the last few years, which redefine representation learning from raw data, a deep neural network structure named Convolutional Bi-directional Long Short-Term Memory networks (CBLSTM) has been designed here to address raw sensory data. CBLSTM firstly uses CNN to extract local features that are robust and informative from the sequential input. Then, bi-directional LSTM is introduced to encode temporal information. Long Short-Term Memory networks(LSTMs) are able to capture long-term dependencies and model sequential data, and the bi-directional structure enables the capture of past and future contexts. Stacked, fully-connected layers and the linear regression layer are built on top of bi-directional LSTMs to predict the target value. Here, a real-life tool wear test is introduced, and our proposed CBLSTM is able to predict the actual tool wear based on raw sensory data. The experimental results have shown that our model is able to outperform several state-of-the-art baseline methods. | URI: | https://hdl.handle.net/10356/87246 http://hdl.handle.net/10220/44339 |
DOI: | 10.3390/s17020273 | Schools: | School of Electrical and Electronic Engineering | Rights: | © 2017 The Author(s); licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons by Attribution (CC-BY) license (http://creativecommons.org/licenses/by/4.0/). | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Journal Articles |
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