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dc.contributor.authorDeng, Jianen
dc.contributor.authorWu, Danen
dc.contributor.authorWang, Kaien
dc.contributor.authorVargas, Javieren
dc.identifier.citationDeng, J., Wu, D., Wang, K., & Vargas, J. (2016). Precise phase retrieval under harsh conditions by constructing new connected interferograms. Scientific Reports, 6, 24416-. doi:10.1038/srep24416en
dc.description.abstractTo date, no phase-shifting method can accurately retrieve the phase map from a small set of noisy interferograms with low phase-shifts. In this Letter, we develop a novel approach to resolve this limitation under such harsh conditions. The proposed new method is based on constructing a set of connected interferograms by means of simple subtraction and addition operations, in which all the subset of interferograms have the same phase-shift interval of π/2. According to this characteristic, this set of connected interferograms can be processed with conventional phase retrieval methods as PCA or AIA obtaining accurate results. The reduction in the RMS errors after using our method reaches as high as 93.7% and 89.3% respectively comparing with conventional PCA and AIA methods under harsh conditions. Both simulation and experiment results demonstrate that the new proposed method provides an effective way, with high precision and robustness against noise, for phase retrieval.en
dc.format.extent10 p.en
dc.relation.ispartofseriesScientific Reportsen
dc.rights© 2016 The Authors (Nature Publishing Group). This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit
dc.subjectInformation Retrievalen
dc.subjectDRNTU::Engineering::Electrical and electronic engineeringen
dc.titlePrecise phase retrieval under harsh conditions by constructing new connected interferogramsen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.description.versionPublished versionen
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