Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/88761
Title: Protecting block ciphers against differential fault attacks without re-keying
Authors: Baksi, Anubhab
Bhasin, Shivam
Breier, Jakub
Khairallah, Mustafa
Peyrin, Thomas
Keywords: Enctyption
Ciphers
DRNTU::Engineering::Computer science and engineering
Issue Date: 2018
Source: Baksi, A., Bhasin, S., Breier, J., Khairallah, M., & Peyrin, T. (2018). Protecting block ciphers against differential fault attacks without re-keying. 2018 IEEE International Symposium on Hardware Oriented Security and Trust (HOST). doi:10.1109/HST.2018.8383913
Abstract: In this article, we propose a new method to protect block cipher implementations against Differential Fault Attacks (DFA). Our strategy, so-called “Tweak-in-Plaintext”, ensures that an uncontrolled value ('tweak-in') is inserted into some part of the block cipher plaintext, thus effectively rendering DFA much harder to perform. Our method is extremely simple yet presents many advantages when compared to previous solutions proposed at AFRICACRYPT 2010 or CARDIS 2015. Firstly, we do not need any Tweakable block cipher, nor any related-key security assumption (we do not perform any re-keying). Moreover, performance for lightweight applications is improved, and we do not need to send any extra data. Finally, our scheme can be directly used with standard block ciphers such as AES or PRESENT. Experimental results show that the throughput overheads, for incorporating our scheme into AES-128, range between ≈ 5% to ≈ 26.9% for software, and between ≈ 3.1% to ≈ 25% for hardware implementations; depending on the tweak-in size.
URI: https://hdl.handle.net/10356/88761
http://hdl.handle.net/10220/47670
DOI: 10.1109/HST.2018.8383913
Rights: © 2018 Institute of Electrical and Electronics Engineers (IEEE). All rights reserved. This paper was published in 2018 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) and is made available with permission of Institute of Electrical and Electronics Engineers (IEEE).
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCSE Conference Papers
SPMS Conference Papers

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