Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/88938
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dc.contributor.authorSurman, Philen
dc.contributor.authorWang, Shizhengen
dc.contributor.authorYuan, Junsongen
dc.contributor.authorZheng, Yuanjinen
dc.date.accessioned2019-05-23T08:21:21Zen
dc.date.accessioned2019-12-06T17:14:09Z-
dc.date.available2019-05-23T08:21:21Zen
dc.date.available2019-12-06T17:14:09Z-
dc.date.issued2018en
dc.identifier.citationSurman, P., Wang, S., Yuan, J., & Zheng, Y. (2018). One-stop measurement model for fast and accurate tensor display characterization. Journal of the Optical Society of America A, 35(2), 346-355. doi:10.1364/JOSAA.35.000346en
dc.identifier.issn1084-7529en
dc.identifier.urihttps://hdl.handle.net/10356/88938-
dc.description.abstractMany light field displays are fundamentally different from other displays in that they do not have quantized pixels, quantized angular outputs, or a physical screen position, which can make definitions and characterization problematic. We have determined that it is more appropriate to express the spatial resolution in terms of spatial cutoff frequency rather than a physical distance as in the case of a display with actual quantized pixels. This concept is then extended to also encompass angular resolution. The technique exploits the fact that when spatial resolution of a sinusoidal grating pattern is halved, its contrast ratio is reduced by a known proportion. An improved model, based on an earlier design concept, has been developed. It not only can be used to measure spatial and angular cutoff frequencies, but also can enable comprehensive characterization of the display. This model provides fast, simple measurement with good accuracy. It does not use special equipment or require time-consuming subjective evaluations. Using the model to characterize images in a rapid, accurate manner validates the effectiveness of this technique.en
dc.description.sponsorshipNRF (Natl Research Foundation, S’pore)en
dc.format.extent11 p.en
dc.language.isoenen
dc.relation.ispartofseriesJournal of the Optical Society of America Aen
dc.rights© 2018 Optical Society of America. All rights reserved. This paper was published in Journal of the Optical Society of America A and is made available with permission of Optical Society of America.en
dc.subjectDRNTU::Engineering::Electrical and electronic engineeringen
dc.subjectDisplaysen
dc.subjectSpatial Filteringen
dc.titleOne-stop measurement model for fast and accurate tensor display characterizationen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.identifier.doi10.1364/JOSAA.35.000346en
dc.description.versionAccepted versionen
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