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Title: Backward phase matching for second harmonic generation in negative-index conformal surface plasmonic metamaterials
Authors: Liu, Liangliang
Wu, Lin
Zhang, Jingjing
Li, Zhuo
Zhang, Baile
Luo, Yu
Keywords: Backward Phase Matching
Efficient Frequency Mixing
DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2018
Source: Liu, L., Wu, L., Zhang, J., Li, Z., Zhang, B., & Luo, Y. Backward phase matching for second harmonic generation in negative-index conformal surface plasmonic metamaterials. Advanced Science, 1800661-. doi:10.1002/advs.201800661
Series/Report no.: Advanced Science
Abstract: Backward phase matching, which describes counterpropagating fundamental and harmonic waves in a negative‐index medium, is one of the most intriguing phenomena in nonlinear metamaterials. Predicted theoretically decades ago, however, it is still a challenging task to be applied for efficient second harmonic (SH) generation in a nonlinear metamaterial with ultrathin geometry and ultralow loss. Here, a negative‐index spoof plasmonic metamaterial is reported, which is composed of an ultrathin symmetrical corrugated metallic strips loaded with nonlinear active devices. The simulated and measured power spectra and surface near‐field distributions show that a peak SH signal can be generated at the backward phase‐matched frequency point in a 120° curved surface with high efficiency, thanks to the ultrathin flexible geometry, significant confinement effect, and large propagation length of the spoof surface plasmons. The results open new technological challenges from nano‐ and micro‐nonlinear photonics to science and engineering of compact, broadband, and efficient frequency‐mixing metamaterials and electromagnetic devices.
DOI: 10.1002/advs.201800661
Rights: © 2018 The Authors. Published by WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and re-production in any medium, provided the original work is properly cited.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles


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