Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/89526
Title: Surface plasmon induced direct detection of long wavelength photons
Authors: Tong, Jinchao
Zhou, Wei
Qu, Yue
Xu, Zhengji
Huang, Zhiming
Zhang, Dao Hua
Keywords: Terahertz Radiation
Surface Plasmon Resonance
Issue Date: 2017
Source: Tong, J., Zhou, W., Qu, Y., Xu, Z., Huang, Z., & Zhang, D. H. (2017). Surface plasmon induced direct detection of long wavelength photons. Nature Communications, 8(1), 1660-.
Series/Report no.: Nature Communications
Abstract: Millimeter and terahertz wave photodetectors have long been of great interest due to a wide range of applications, but they still face challenges in detection performance. Here, we propose a new strategy for the direct detection of millimeter and terahertz wave photons based on localized surface-plasmon-polariton (SPP)-induced non-equilibrium electrons in antenna-assisted subwavelength ohmic metal–semiconductor–metal (OMSM) structures. The subwavelength OMSM structure is used to convert the absorbed photons into localized SPPs, which then induce non-equilibrium electrons in the structure, while the antenna increases the number of photons coupled into the OMSM structure. When the structure is biased and illuminated, the unidirectional flow of the SPP-induced non-equilibrium electrons forms a photocurrent. The energy of the detected photons is determined by the structure rather than the band gap of the semiconductor. The detection scheme is confirmed by simulation and experimental results from the devices, made of gold and InSb, and a room temperature noise equivalent power (NEP) of 1.5 × 10−13 W Hz−1/2 is achieved.
URI: https://hdl.handle.net/10356/89526
http://hdl.handle.net/10220/44973
ISSN: 2041-1723
DOI: 10.1038/s41467-017-01828-2
Rights: © 2017 The Author(s). This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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