Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/89537
Title: Visual pattern degradation based image quality assessment
Authors: Wu, Jinjian
Li, Leida
Shi, Guangming
Lin, Weisi
Wan, Wenfei
Keywords: Full-Reference
DRNTU::Engineering::Computer science and engineering
Image Quality Assessment
Issue Date: 2015
Source: Wu, J., Li, L., Shi, G., Lin, W., & Wan, W. (2015). Visual pattern degradation based image quality assessment. Proceedings of SPIE - 2015 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 9622, 96220P-. doi:10.1117/12.2192967
Abstract: In this paper, we introduce a visual pattern degradation based full-reference (FR) image quality assessment (IQA) method. Researches on visual recognition indicate that the human visual system (HVS) is highly adaptive to extract visual structures for scene understanding. Existing structure degradation based IQA methods mainly take local luminance contrast to represent structure, and measure quality as degradation on luminance contrast. In this paper, we suggest that structure includes not only luminance contrast but also orientation information. Therefore, we analyze the orientation characteristic for structure description. Inspired by the orientation selectivity mechanism in the primary visual cortex, we introduce a novel visual pattern to represent the structure of a local region. Then, the quality is measured as the degradations on both luminance contrast and visual pattern. Experimental results on Five benchmark databases demonstrate that the proposed visual pattern can effectively represent visual structure and the proposed IQA method performs better than the existing IQA metrics.
URI: https://hdl.handle.net/10356/89537
http://hdl.handle.net/10220/47094
DOI: 10.1117/12.2192967
Rights: © 2015 Society of Photo-optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE - 2015 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology and is made available as an electronic reprint (preprint) with permission of Society of Photo-optical Instrumentation Engineers (SPIE). The published version is available at: [http://dx.doi.org/10.1117/12.2192967]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCSE Conference Papers

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