Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/89552
Title: Wavefront subaperture stitching with Shack-Hartmann sensor
Authors: Li, Hongru
Feng, Guoying
Sun, Jianfei
Bourgade, Thomas
Zhou, Shouhuan
Asundi, Anand
Keywords: DRNTU::Engineering::Mechanical engineering
Phase Retrieval
Optical Testing
Issue Date: 2015
Source: Li, H., Feng, G., Sun, J., Bourgade, T., Zhou, S., & Asundi, A. (2015). Wavefront subaperture stitching with Shack-Hartmann sensor. Proceedings of SPIE - International Conference on Optical and Photonic Engineering (icOPEN2015), 9524, 95241E-. doi:10.1117/12.2189452
Conference: Proceedings of SPIE - International Conference on Optical and Photonic Engineering (icOPEN2015)
Abstract: A new approach for large field of view measurement using the Shack-Hartmann wavefront sensor (SHWS) is proposed. The object to be measured is divided into several subaperture units. Each unit is measured using the SHWS and a new algorithm is applied to stitch these units. Both theoretical principle and experimental verification are provided in this paper. A comparison between the present global optimization stitching scheme with the conventional sequential stitching method highlights the benefits of the new system. Experimental validation of the SHWS stitching algorithm is carried out by using a coated mirror. Comparison is made with a phase shifting interferometer and good agreement is found. Lastly, a new methodology for large aperture measurement of optical components is provided.
URI: https://hdl.handle.net/10356/89552
http://hdl.handle.net/10220/47095
DOI: 10.1117/12.2189452
Schools: School of Mechanical and Aerospace Engineering 
Research Centres: Centre for Optical and Laser Engineering 
Rights: © 2015 Society of Photo-optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE - International Conference on Optical and Photonic Engineering (icOPEN2015) and is made available as an electronic reprint (preprint) with permission of Society of Photo-optical Instrumentation Engineers (SPIE). The published version is available at: [http://dx.doi.org/10.1117/12.2189452]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Conference Papers

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