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|Title:||Landau velocity for collective quantum hall breakdown in bilayer graphene||Authors:||Yang, W.
Teo, Edwin Hang Tong
Goerbig, M. O.
|Keywords:||Electromagnetic Wave Scattering
DRNTU::Engineering::Electrical and electronic engineering
|Issue Date:||2018||Source:||Yang, W., Graef, H., Lu, X., Zhang, G., Taniguchi, T., Watanabe, K., . . . Plaçais, B. (2018). Landau Velocity for Collective Quantum Hall Breakdown in Bilayer Graphene. Physical Review Letters, 121(13), 136804-. doi:10.1103/PhysRevLett.121.136804||Series/Report no.:||Physical Review Letters||Abstract:||Breakdown of the quantum Hall effect (QHE) is commonly associated with an electric field approaching the inter-Landau-level (LL) Zener field, the ratio of the Landau gap and the cyclotron radius. Eluded in semiconducting heterostructures, in spite of extensive investigation, the intrinsic Zener limit is reported here using high-mobility bilayer graphene and high-frequency current noise. We show that collective excitations arising from electron-electron interactions are essential. Beyond a noiseless ballistic QHE regime a large super-Poissonian shot noise signals the breakdown via inter-LL scattering. The breakdown is ultimately limited by collective excitations in a regime where phonon and impurity scattering are quenched. The breakdown mechanism can be described by a Landau critical velocity as it bears strong similarities with the roton mechanism of superfluids. In addition, we show that breakdown is a precursor of an electric-field induced QHE-metal transition.||URI:||https://hdl.handle.net/10356/89661
|ISSN:||0031-9007||DOI:||10.1103/PhysRevLett.121.136804||Rights:||© 2018 American Physical Society. This paper was published in Physical Review Letters and is made available as an electronic reprint (preprint) with permission of American Physical Society. The published version is available at: [http://dx.doi.org/10.1103/PhysRevLett.121.136804]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Journal Articles|
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