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Title: Characterization and optimization of illumination vector for contouring surface form and feature using DSPI
Authors: Song, Chaolong
Prasad, A. S. Guru
Chan, Kelvin H. K.
Murukeshan, Vadakke Matham
Keywords: DRNTU::Engineering::Mechanical engineering
Linear Filters
Acoustic Noise
Issue Date: 2016
Source: Song, C., Prasad, A. S. G., Chan, K. H. K., & Murukeshan, V. M. (2016). Characterization and optimization of illumination vector for contouring surface form and feature using DSPI. Review of Scientific Instruments, 87(6), 063116-. doi:10.1063/1.4953884
Series/Report no.: Review of Scientific Instruments
Abstract: Surface defect or damage is one of the critical factors leading to the failure of engineering materials and structures. The methodologies for the measurement of surface shape and feature or defect have been extensively explored and developed over the past few decades, including both contact and non-contact methods. Speckle pattern interferometry, as a non-contact optical method, has been demonstrated to effectively contour the surface shape through adjusting the illumination vector. However, few studies have been made to investigate the effect of the initial position of the illumination source as well as the source translation direction. In this paper, we report to carry out a study of measuring the surface form and feature using digital speckle pattern interferometry system via a slight translation of illumination source. Through theoretically analyzing the sensitivity factor along with the experimental validation, it is shown that the contouring fringe is more sensitive to the surface height with an off-axis illumination than the paraxial illumination. It is also found that translating the source along axial and lateral direction can be both used for the surface shape re-construction.
ISSN: 0034-6748
DOI: 10.1063/1.4953884
Schools: School of Mechanical and Aerospace Engineering 
Research Centres: Rolls-Royce@NTU Corporate Lab 
Rights: © 2016 The Author(s) (Published by AIP). This paper was published in Review of Scientific Instruments and is made available as an electronic reprint (preprint) with permission of The Author(s) (Published by AIP). The published version is available at: []. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
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