Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/89763
Title: Germanium-on-silicon waveguides operating at mid-infrared wavelengths up to 85 μm
Authors: Nedeljkovic, Milos
Penades, Jordi Soler
Mittal, Vinita
Murugan, Ganapathy Senthil
Khokhar, Ali Z.
Littlejohns, Callum
Carpenter, Lewis G.
Gawith, Corin B. E.
Wilkinson, James S.
Mashanovich, Goran Z.
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Integrated Optics
Infrared
Issue Date: 2017
Source: Nedeljkovic, M., Penades, J. S., Mittal, V., Murugan, G. S., Khokhar, A. Z., Littlejohns, C., . . . Mashanovich, G. Z. (2017). Germanium-on-silicon waveguides operating at mid-infrared wavelengths up to 85 μm. Optics Express, 25(22), 27431-27441. doi:10.1364/OE.25.027431
Series/Report no.: Optics Express
Abstract: We report transmission measurements of germanium on silicon waveguides in the 7.5–8.5 μm wavelength range, with a minimum propagation loss of 2.5 dB/cm at 7.575 μm. However, we find an unexpected strongly increasing loss at higher wavelengths, potential causes of which we discuss in detail. We also demonstrate the first germanium on silicon multimode interferometers operating in this range, as well as grating couplers optimized for measurement using a long wavelength infrared camera. Finally, we use an implementation of the “cut-back” method for loss measurements that allows simultaneous transmission measurement through multiple waveguides of different lengths, and we use dicing in the ductile regime for fast and reproducible high quality optical waveguide end-facet preparation.
URI: https://hdl.handle.net/10356/89763
http://hdl.handle.net/10220/46376
ISSN: 1094-4087
DOI: 10.1364/OE.25.027431
Schools: School of Electrical and Electronic Engineering 
Research Centres: Silicon Technologies, Centre of Excellence 
Rights: © 2017 The Author(s). Published by The Optical Society under the terms of the Creative Commons Attribution 4.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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