Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/89766
Title: A fully soft generator with embedded conditioning circuitry
Authors: Wang, Yongquan
Zhu, Liangquan
Zhang, Gong
Chen, Hualing
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Smart Materials
Electronic Devices
Issue Date: 2018
Source: Wang, Y., Zhu, L., Zhang, G., & Chen, H. (2018). A fully soft generator with embedded conditioning circuitry. Applied Physics Letters, 113(11), 113904-. doi:10.1063/1.5036777
Series/Report no.: Applied Physics Letters
Abstract: This letter presents a fully soft dielectric elastomer generator (DEG) based on a capacitive kinetic-energy-harvesting mechanism. First, using the principle of a passive charge pump, a self-cycling conditioning circuit topology is proposed. Through the electrical reciprocity of a cyclically deforming DEG and another capacitor in series with it, the generated charge can be continuously supplied to the load, via a bilateral conditioning bridge. The antagonistic dual-DEG scheme not only produces a larger potential to drive more charge in the flow but also provides a basic solution to soften the whole device. A further measure is to replace the bridge diodes with special dielectric elastic switches (DESs), which can be embedded into the DEG and synchronously deformed with the latter to control the on/off state of the circuit branches. The intrinsic physical mechanism and characteristics of the change in the resistance of the DES as a function of stretch and electric fields are investigated. We tested and compared the diode-bridge and DES-bridge schemes under different electrical loads and tensile strokes. The results indicate that under certain conditions, the DES-bridge circuit can achieve comparable performance with that of a conventional scheme, which suggests that a fully soft DEG system is possible. We experimentally evaluated and discussed its reliability in practice.
URI: https://hdl.handle.net/10356/89766
http://hdl.handle.net/10220/46361
ISSN: 0003-6951
DOI: 10.1063/1.5036777
Schools: School of Electrical and Electronic Engineering 
Rights: © 2018 The Author(s) (Published by AIP). This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of The Author(s) (Published by AIP). The published version is available at: [http://dx.doi.org/10.1063/1.5036777]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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