Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/89823
Title: Avoiding short circuits from zinc metal dendrites in anode by backside-plating configuration
Authors: Higashi, Shougo
Lee, Seok Woo
Lee, Jang Soo
Takechi, Kensuke
Cui, Yi
Keywords: Physical Chemistry
DRNTU::Engineering::Electrical and electronic engineering
Batteries
Issue Date: 2016
Source: Higashi, S., Lee, S. W., Lee, J. S., Takechi, K., & Cui, Y. (2016). Avoiding short circuits from zinc metal dendrites in anode by backside-plating configuration. Nature Communications, 7, 11801-. doi:10.1038/ncomms11801
Series/Report no.: Nature Communications
Abstract: Portable power sources and grid-scale storage both require batteries combining high energy density and low cost. Zinc metal battery systems are attractive due to the low cost of zinc and its high charge-storage capacity. However, under repeated plating and stripping, zinc metal anodes undergo a well-known problem, zinc dendrite formation, causing internal shorting. Here we show a backside-plating configuration that enables long-term cycling of zinc metal batteries without shorting. We demonstrate 800 stable cycles of nickel–zinc batteries with good power rate (20 mA cm−2, 20 C rate for our anodes). Such a backside-plating method can be applied to not only zinc metal systems but also other metal-based electrodes suffering from internal short circuits.
URI: https://hdl.handle.net/10356/89823
http://hdl.handle.net/10220/47159
DOI: 10.1038/ncomms11801
Schools: School of Electrical and Electronic Engineering 
Rights: © 2016 The Author(s) (Published by Nature Publishing Group). This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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