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Title: Optimal multi-objective burn-in policy based on time-transformed Wiener degradation process
Authors: Lyu, Yi
Zhang, Yun
Chen, Kairui
Chen, Ci
Zeng, Xianxian
Keywords: Degradation
Wiener Process
Engineering::Electrical and electronic engineering
Issue Date: 2019
Source: Lyu, Y., Zhang, Y., Chen, K., Chen, C., & Zeng, X. (2019). Optimal multi-objective burn-in policy based on time-transformed Wiener degradation process. IEEE Access, 7, 73529-73539. doi:10.1109/ACCESS.2019.2918510
Series/Report no.: IEEE Access
Abstract: Burn-in is an effective and widely used means to improve product reliability by eliminating weak units before they are distributed in the market. Traditional burn-in that distinguishes weak units by failure during testing is inefficient and incompetent for degradation-failed products in which weak units degrade faster than normal individuals. Hence, the manufacturers have to turn to the degradation-based method. The mean lifetime to failure (MTTF) of a burnt-in population is diminished because of this type of burn-in increases the degradation level of all tested units. Ignoring the impact of burn-in leads to inferior test decisions. This study develops a multi-objective burn-in method that can simultaneously minimize the burn-in cost and maximize the burnt-in population's MTTF. We employ the time-transformed Wiener process with random effects to model the nonlinear degradation path of products and develop a burn-in scheme with two decision variables, namely, test duration and screening cutoff level. Cost expression and lifetime-based optimal objective are analytically developed. The optimal test policy is determined using the multi-objective evolutionary algorithm based on decomposition. A simulation study is conducted to demonstrate the usage and effectiveness of the multi-objective burn-in method.
DOI: 10.1109/ACCESS.2019.2918510
Rights: Articles accepted before 12 June 2019 were published under a CC BY 3.0 or the IEEE Open Access Publishing Agreement license. Questions about copyright policies or reuse rights may be directed to the IEEE Intellectual Property Rights Office at +1-732-562-3966 or
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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