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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lyu, Yi | en |
dc.contributor.author | Zhang, Yun | en |
dc.contributor.author | Chen, Kairui | en |
dc.contributor.author | Chen, Ci | en |
dc.contributor.author | Zeng, Xianxian | en |
dc.date.accessioned | 2019-07-16T01:21:04Z | en |
dc.date.accessioned | 2019-12-06T17:39:28Z | - |
dc.date.available | 2019-07-16T01:21:04Z | en |
dc.date.available | 2019-12-06T17:39:28Z | - |
dc.date.issued | 2019 | en |
dc.identifier.citation | Lyu, Y., Zhang, Y., Chen, K., Chen, C., & Zeng, X. (2019). Optimal multi-objective burn-in policy based on time-transformed Wiener degradation process. IEEE Access, 7, 73529-73539. doi:10.1109/ACCESS.2019.2918510 | en |
dc.identifier.uri | https://hdl.handle.net/10356/90045 | - |
dc.description.abstract | Burn-in is an effective and widely used means to improve product reliability by eliminating weak units before they are distributed in the market. Traditional burn-in that distinguishes weak units by failure during testing is inefficient and incompetent for degradation-failed products in which weak units degrade faster than normal individuals. Hence, the manufacturers have to turn to the degradation-based method. The mean lifetime to failure (MTTF) of a burnt-in population is diminished because of this type of burn-in increases the degradation level of all tested units. Ignoring the impact of burn-in leads to inferior test decisions. This study develops a multi-objective burn-in method that can simultaneously minimize the burn-in cost and maximize the burnt-in population's MTTF. We employ the time-transformed Wiener process with random effects to model the nonlinear degradation path of products and develop a burn-in scheme with two decision variables, namely, test duration and screening cutoff level. Cost expression and lifetime-based optimal objective are analytically developed. The optimal test policy is determined using the multi-objective evolutionary algorithm based on decomposition. A simulation study is conducted to demonstrate the usage and effectiveness of the multi-objective burn-in method. | en |
dc.format.extent | 11 p. | en |
dc.language.iso | en | en |
dc.relation.ispartofseries | IEEE Access | en |
dc.rights | Articles accepted before 12 June 2019 were published under a CC BY 3.0 or the IEEE Open Access Publishing Agreement license. Questions about copyright policies or reuse rights may be directed to the IEEE Intellectual Property Rights Office at +1-732-562-3966 or copyrights@ieee.org. | en |
dc.subject | Degradation | en |
dc.subject | Wiener Process | en |
dc.subject | Engineering::Electrical and electronic engineering | en |
dc.title | Optimal multi-objective burn-in policy based on time-transformed Wiener degradation process | en |
dc.type | Journal Article | en |
dc.contributor.school | School of Electrical and Electronic Engineering | en |
dc.identifier.doi | 10.1109/ACCESS.2019.2918510 | en |
dc.description.version | Published version | en |
item.fulltext | With Fulltext | - |
item.grantfulltext | open | - |
Appears in Collections: | EEE Journal Articles |
Files in This Item:
File | Description | Size | Format | |
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Optimal Multi-Objective Burn-In Policy Based on Time-Transformed Wiener Degradation Process.pdf | 4.56 MB | Adobe PDF | View/Open |
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