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Title: Spectral domain optical coherence tomography with extended depth-of-focus by aperture synthesis
Authors: Bo, En
Liu, Linbo
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Medical and Biological Imaging
Optical Coherence Tomography
Issue Date: 2016
Source: Bo, E., & Liu, L. (2016). Spectral domain optical coherence tomography with extended depth-of-focus by aperture synthesis. Optics in Health Care and Biomedical Optics VII, 10024, 1002451-. doi:10.1117/12.2239997
Abstract: We developed a spectral domain optical coherence tomography (SD-OCT) with an extended depth-of-focus (DOF) by synthetizing aperture. For a designated Gaussian-shape light source, the lateral resolution was determined by the numerical aperture (NA) of the objective lens and can be approximately maintained over the confocal parameter, which was defined as twice the Rayleigh range. However, the DOF was proportional to the square of the lateral resolution. Consequently, a trade-off existed between the DOF and lateral resolution, and researchers had to weigh and judge which was more important for their research reasonably. In this study, three distinct optical apertures were obtained by imbedding a circular phase spacer in the sample arm. Due to the optical path difference between three distinct apertures caused by the phase spacer, three images were aligned with equal spacing along z-axis vertically. By correcting the optical path difference (OPD) and defocus-induced wavefront curvature, three images with distinct depths were coherently summed together. This system digitally refocused the sample tissue and obtained a brand new image with higher lateral resolution over the confocal parameter when imaging the polystyrene calibration beads.
DOI: 10.1117/12.2239997
Rights: © 2016 Society of Photo-optical Instrumentation Engineers (SPIE). This paper was published in Optics in Health Care and Biomedical Optics VII and is made available as an electronic reprint (preprint) with permission of Society of Photo-optical Instrumentation Engineers (SPIE). The published version is available at: []. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
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