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Title: Time-variant in-circuit impedance monitoring based on the inductive coupling method
Authors: Zhao, Zhenyu
See, Kye-Yak
Chua, Eng-Kee
Narayanan, Arun Shankar
Chen, Wayne
Weerasinghe, Arjuna
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Discrete Fourier Transform In A Moving Window
Inductive Coupling
Issue Date: 2018
Source: Zhao, Z., See, K.-Y., Chua, E.-K., Narayanan, A. S., Chen, W., & Weerasinghe, A. (2019). Time-variant in-circuit impedance monitoring based on the inductive coupling method. IEEE Transactions on Instrumentation and Measurement, 68(1), 169-176. doi:10.1109/TIM.2018.2838198
Series/Report no.: IEEE Transactions on Instrumentation and Measurement
Abstract: In-circuit impedance extraction of a time-variant electrical system is essential for real-time condition monitoring purpose. This paper looks into the design consideration of real-time in-circuit monitoring for a time-variant system based on inductive coupling approach and discrete Fourier transform in a moving window. By using two clamped-on-type inductive probes, the proposed setup eliminates the need of voltage sensors to measure the terminal voltages of system-under-monitoring (SUM) and, hence, eliminates direct electrical contact with the SUM. Therefore, it facilitates ease of mounting and disassembly. Experimental results show that with careful design consideration, the proposed method has the ability to measure the in-circuit impedance of a time-variant system in real time, which facilitates useful inputs for early detection of abnormality of the monitored electrical system that is time variant in nature.
ISSN: 0018-9456
DOI: 10.1109/TIM.2018.2838198
Rights: © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at:
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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