Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/90269
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dc.contributor.authorPrajapati, Manishen
dc.contributor.authorSee, Kye Yaken
dc.date.accessioned2019-06-21T06:57:46Zen
dc.date.accessioned2019-12-06T17:44:27Z-
dc.date.available2019-06-21T06:57:46Zen
dc.date.available2019-12-06T17:44:27Z-
dc.date.issued2018en
dc.identifier.citationPrajapati, M., & See, K. Y. Extraction of equivalent noise source model from photovoltaic systems. IEEE Transactions on Electromagnetic Compatibility, 61(3), 903-910. doi:10.1109/TEMC.2018.2836665en
dc.identifier.issn0018-9375en
dc.identifier.urihttps://hdl.handle.net/10356/90269-
dc.description.abstractPhotovoltaic (PV) systems have become popular as one of the renewable energy sources in recent years. With increasing number of PV systems, potential electromagnetic interference (EMI) issues from the PV systems cannot be ignored. In order to evaluate the EMI potential of a PV system, an in-circuit measurement method to extract its equivalent common-mode and differential-mode noise source models is described and validated. These noise source models serve as black boxes for further EMI analyses.en
dc.format.extent8 p.en
dc.language.isoenen
dc.relation.ispartofseriesIEEE Transactions on Electromagnetic Compatibilityen
dc.rights© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/TEMC.2018.2836665en
dc.subjectElectromagnetic Compatibilityen
dc.subjectElectromagnetic Interferenceen
dc.subjectDRNTU::Engineering::Electrical and electronic engineeringen
dc.titleExtraction of equivalent noise source model from photovoltaic systemsen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.identifier.doi10.1109/TEMC.2018.2836665en
dc.description.versionAccepted versionen
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Appears in Collections:EEE Journal Articles
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