Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/90825
Title: THD of closed-loop analog PWM class-D amplifiers
Authors: Shu, Wei
Chang, Joseph Sylvester
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
Issue Date: 2008
Source: Shu, W., & Chang, J. S. (2008). THD of closed-loop analog PWM class-D amplifiers. IEEE transactions on circuits and systems part 1 regular papers, 55(6), 1769-1777.
Series/Report no.: IEEE transactions on circuits and systems part 1 regular papers
Abstract: This paper presents an analytical modeling of the mechanisms of total harmonic distortion (THD) of second-order based single-feedback and double-feedback Class-D amplifiers (CDAs). We show that the overall THD in these closed-loop CDAs comprises the THD of their open-loop counterparts reduced by the Loop Gain and the THD due to the combined phase and duty cycle error that is due to feedback, hence unique to closed-loop CDAs. We show that the latter THD can be large and is the dominant THD at high input frequencies, and that the mechanisms therein are the phase and duty cycle errors. By means of double Fourier series analysis, analytical expressions for the harmonic components and thereafter a THD expression for closed-loop CDAs are derived. The derived expressions depict the parameters that affect THD, and are insightful to designers to optimize/vary pertinent parameters to reduce THD. The derived THD expression is verified against HSPICE and on the basis of measurements on a prototype CDA IC and other CDAs realized discretely.
URI: https://hdl.handle.net/10356/90825
http://hdl.handle.net/10220/6338
ISSN: 1549-8328
DOI: 10.1109/TCSI.2008.918000
Rights: © 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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