Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/91355
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dc.contributor.authorXu, C. D.en
dc.contributor.authorMei, Tingen
dc.contributor.authorDong, Jian Rongen
dc.date.accessioned2010-09-02T08:08:15Zen
dc.date.accessioned2019-12-06T18:04:11Z-
dc.date.available2010-09-02T08:08:15Zen
dc.date.available2019-12-06T18:04:11Z-
dc.date.copyright2007en
dc.date.issued2007en
dc.identifier.citationXu, C. D., Mei, T., & Dong J. R. (2007). Determination of diffusion lengths for intermixed quaternary quantum well with polarized edge-emitting photoluminescence. Applied Physics Letters, 90, 1-3.en
dc.identifier.issn0003-6951en
dc.identifier.urihttps://hdl.handle.net/10356/91355-
dc.identifier.urihttp://hdl.handle.net/10220/6397en
dc.description.abstractDiffusion lengths of the group III and V sublattices are quantitatively determined for intermixing of a quaternary InGaAs/InP quantum well using polarized edge-emitting photoluminescence. Diffusion-length loci are plotted on a contour diagram of wavelength shifts of electron-heavy-hole and electron-light-hole transitions and illustrate the time progression of intermixing clearly. The plasma-enhanced intermixing effect is investigated using this technique, showing the difference of intermixing development in the early and the late stages. It is seen that the calculated diffusion-length ratio may change with the annealing duration.en
dc.format.extent3 p.en
dc.language.isoenen
dc.relation.ispartofseriesApplied physics lettersen
dc.rightsApplied Physics Letters © copyright 2007 American Institute of Physics. The journal's website is located at http://apl.aip.org/applab/v90/i19/p191111_s1?isAuthorized=noen
dc.subjectDRNTU::Engineering::Electrical and electronic engineeringen
dc.titleDetermination of diffusion lengths for intermixed quaternary quantum well with polarized edge-emitting photoluminescenceen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.contributor.organizationA*STAR Institute of Materials Research and Engineeringen
dc.identifier.doihttp://dx.doi.org/10.1063/1.2737125en
dc.description.versionPublished versionen
item.grantfulltextopen-
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