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Title: Synthesis of very sharp Hilbert transformer using the frequency-response masking technique
Authors: Lim, Yong Ching
Yu, Ya Jun
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2005
Source: Lim, Y. C., & Yu, Y. J. (2005). Synthesis of very sharp Hilbert transformer using the frequency-response masking technique. IEEE Transactions on Signal Processing, 53(7), 2595-2597.
Series/Report no.: IEEE transactions on signal processing
Abstract: Frequency translation of audio signals requires the use of very sharp Hilbert transformer if the lowfr equency components are to be faithfully translated. Unfortunately, the order of a very sharp Hilbert transformer is very high, resulting in very high arithmetic complexity. The frequency-response masking (FRM) technique has been used very successfully for greatly reducing the complexity of extremely sharp halfband filters. There is a very close relationship between a halfband filter and a Hilbert transformer. In this correspondence, we propose to synthesize a very sharp Hilbert transformer using the FRM technique via the synthesis of a very sharp halfband filter.
ISSN: 1053-587X
DOI: 10.1109/TSP.2005.849206
Schools: School of Electrical and Electronic Engineering 
Rights: © 2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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